| Starts: | Sunday November 15, 2009 at 8:00am |
|---|---|
| Ends: | Thursday November 19, 2009 at 5:00pm |
| Event Type: | Conference |
| Region: | San Francisco Bay Area |
| Location: |
McEnery Convention Center 150 West San Carlos St. San Jose, CA 95113 US |
| Price: | |
| Website: | http://asmcommunity.asminternational.org/content/Events/istfa/ |
| Industry: | semiconductors |
| Keywords: | Failure Analysis, Fault Localization, Photoemission, Laser Stimulation, Obirch, Phemos |
| Intended For: | FA engineer, failure analysis engineer, fa manager, failure analysis manager, yield engineer, yield manager, fault isolation engineer |
| Organization: | EDFAS |
The industry’s premier event for microanalysis professionals.
* Hear original, unpublished work on FA topics presented by industry professionals from around the world.
* Attend technology-specific user groups.
* Learn more and take advantage of educational short courses and maximize your ISTFA experience.
* Do business and network at North America’s largest FA-related tradeshow.